Equipments

The X-ray diffractometer is a device that obtains information on the grating structure of a sample by using diffraction lines generated when X-rays are irradiated on a sample. Crystalline earth matter, such as minerals, causes constructive interference with the -line irradiated at a specific angle of incidence by the crystal plane appearing in the internal lattice structure, through which the lattice structure of the sample belongs to which crystal system and the symmetry of the lattice structure. You can infer whether there is. Particularly, when the composition of the sample is known, it is possible to know which minerals the sample is composed of through the results of X-ray diffraction analysis. In the case of amorphous earth matter, a diffraction pattern can be obtained due to the atomic structure in which the characteristic lattice structure disappears.